Authors: |
Hanlin Liao* / LERMPS - UTBM, France Xueping Guo / LERMPS, University of Technology of Belfort-Montbéliard, France Yang Gao/ Electromechanics and Materials Engineering College, Dalian Maritime University , China Christian Coddet/ LERMPS, University of Technology of Belfort-Montbéliard, France
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