Abstract No.:	4669
Title:	Influnce of SiO2 content on high-temperature aging microstructure of YSZ thermal barrier coating
Authors:	Xiaojuan Ji* / Beijing General Research Institute of mining and metallurgy, China Yueguang Yu/ Beijing General Research Institute of Mining and Metallurgy, China Hongwei Huang/ Beijing General Research Institute of Mining and Metallurgy, China Wei'ao Hou/ Beijing General Research Institute of Mining and Metallurgy, China
Abstract:	As a kind of low melting point oxide, SiO2 can decrease the anti sintering property of YSZ coating, but it is also an inevitable impurity in YSZ coating. In this paper, the contents of SiO2 in YSZ coatings were 0.02%, 0.05%, 0.1% and 1%, respectively. The microstructure of the above YSZ coatings after high-temperature aging at 1000 was studied. With the increase of the content of SiO2, the aging time of the grain growth was shortened, and at a certain time the grain growed obviously.The aging treatment of YSZ coatings with different SiO2 contents was carried out at 1000, 1100 and 1150 at the time of aging above. With the increase of temperature, the different content of SiO2 did not change the aging time of grain growth before the phase structure of the YSZ coating was changed.SEM, XRD, TEM was used to analysis the microstructure of the coatings.

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