Abstract No.:	4810
Title:	Non-destructive micro-structural characterization of thermal barrier coating
Authors:	Qijun Ren* / Carl Zeiss Shanghai Co. Ltd, China Gang Li / Carl Zeiss Shanghai Co. Ltd, China Xiaofeng Zhang/ Guangzhou Research Institute of Non-ferrous Metals, China
Abstract:	X-Ray Microscope is an non-destructive method with novel resolution than traditional method of analysis. We use the X-Ray tomography to comprehensively study the thermal barrier coating properties and insulating performances, and we found they are strongly dependent largely with the microstructures, including pore morphology, porosity, coating thickness, and microcrack formations.

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