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5326 |
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Investigation of interfacial microstructures between LZ splats and YSZ substrate by HR-TEM |
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Lin Chen / Xi'an Jiaotong University, P.R. China F. Young* / Xi'an Jiaotong University, P.R. China Guan-jun Yang/ Xi'an Jiaotong University, China Cheng-xin Li/ Xi'an Jiaotong University, China Chang-jiu Li/ Xi'an Jiaotong University, China |
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Thermally-sprayed LZ/YSZ double-layer coatings are promising candidate for the next generation thermal barrier coatings (TBCs) due to exceedingly low thermal conductivity and superior high-temperature phase stability. However, a delamination failure at LZ and YSZ interface were widely observed during TBCs service. Till today, the interfacial microstructure between LZ and YSZ remains unclear. In the present study, LZ splats were deposited on YSZ substrate. The interfacial microstructure was explored by focused ion beam (FIB) and high-resolution transmission electron microscope (HR-TEM). The interfacial defects at splat interface were clearly observed and thoroughly discussed. These results would shed light to deeply understand the interfacial failure of double-layer LZ/YSZ coatings. |