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6862 |
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Tuesday, March 09, 2021, Hall 1 1:35 PM Education, Diagnostics and Control Technologies |
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Process monitoring in electron beam welding by optimizing the in-process sensor technology by means of backscattered electrons and optical emission |
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Stefan Gach* / RWTH Aachen, Welding and Joining Institute, Germany Simon Olschok / Welding and Joining Institute (ISF) - RWTH Aachen University, Germany Uwe Reisgen/ Welding and Joining Institute (ISF) - RWTH Aachen University, Germany |
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The demands of the market on manufacturing companies and their products require a time and cost efficient production. There is an ever-increasing need to make welding production more transparent and to ensure and document processes and quality in order to be able to meet the requirements of customers as well as laws and regulations. The extension of sensor technology in electron beam welding can contribute to the achievement of these objectives - by integrating the detection of discrete wavelength ranges of optical process emissions, opti-mizing the detection of backscattered electrons and correlating the measurement signals to process changes and events, irregularities can be detected in-situ. The presented investigations include the further development of the detection and analysis of backscattered electrons and the utilization of optical sensors for the electron beam process. Weldings are performed with the simulation of typical failure scenarios. The data are evaluat-ed with the aim to find temporal and causal correlations to the induced defects. It is investi-gated whether the correlation to welding defects of the combination of optical and conven-tional sensor technology is also possible with the optimized backscatter electron sensor tech-nology alone. In the field of optical sensors the identification of characteristic optical process emissions by spectroscopy and a selection of suitable photodiodes and band-pass filters based on these results is investigated. |