Abstract No.:
3770

 Scheduled at:
Wednesday, May 21, 2014, Hall F 2:40 PM
Suspension Spraying 1


 Title:
Effects of process parameters on surface wettability of sprayed oxide ceramic coatings by APS and SPS

 Authors:
Navid Sharifi* / Concordia University, Canada
Martin Pugh / Department of Mechanical and Industrial Engineering, Concordia University, Canada
Christian Moreau/ Department of Mechanical and Industrial Engineering, Concordia University, Canada
Ali Dolatabadi/ Department of Mechanical and Industrial Engineering, Concordia University, Canada

 Abstract:
The wetting behavior of a solid surface depends on the interaction between the solid and a liquid. For certain applications where a minimized adhesion between the solid and the liquid is desired, low wettability of the surface is anticipated. For instance, to prevent ice formation on aerodynamic surfaces of an airplane, coatings with very low water wettability  called superhydrophobicity  have proven to be highly effective. However, intrinsically superhydrophobic materials are mainly polymers that lack durability and therefore have limited industrial applications. On the other hand, oxide ceramics are much more durable, but they are naturally hydrophilic (i.e. high water wettability). Fortunately, the wettability of a surface can be altered by not only its chemical composition, but also its surface morphology.
In this study, oxide ceramics (i.e. TiO2, ZnO, and SiO2) and their mixtures are deposited using both atmospheric plasma spraying (APS) and suspension plasma spraying (SPS) techniques. The wetting behavior of these coatings and the effects of process parameters on the wettability of the coatings are investigated. To characterize surface morphology of the coatings and its relation to the surface wettability, Scanning Electron Microscopy (SEM) and Confocal Laser Scanning Microscopy (CLSM) are employed. In addition, chemical composition and crystal structure of the coatings are studied using Energy-Dispersive X-ray Spectroscopy (EDS) and X-Ray Diffractometry (XRD).


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